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DFT   2008 IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Wall of Fame | Most Viewed DFT-2008 Paper
DFT
2008
IEEE
182views VLSI» more  DFT 2008»
8 years 12 months ago
Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis
This paper addresses a new threat to the security of integrated circuits (ICs). The migration of IC fabrication to untrusted foundries has made ICs vulnerable to malicious alterat...
Xiaoxiao Wang, Hassan Salmani, Mohammad Tehranipoo...
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