DFT 2008 IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
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Wall of Fame | Most Viewed DFT-2008 Paper
DFT
2008
IEEE
13 years 6 months ago
2008
IEEE
This paper addresses a new threat to the security of integrated circuits (ICs). The migration of IC fabrication to untrusted foundries has made ICs vulnerable to malicious alterat...
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