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    ITC
    1996
    IEEE
    96views Hardware» more  ITC 1996»
    Analysis and Detection of Timing Failures in an Experimental Test Chip
    13 years 9 months ago
    Analysis and Detection of Timing Failures in an Experimental Test Chip
    Download  www-crc.stanford.edu
    A 25k gate Test Chip was designed and manufactured to evaluate different test methods for scan-designed circuits. The design of the chip, the experiment, and preliminary experimen...
    Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin...
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