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    IOLTS
    2008
    IEEE
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    Verification and Analysis of Self-Checking Properties through ATPG
    13 years 11 months ago
    Verification and Analysis of Self-Checking Properties through ATPG
    Download  www.date.uni-paderborn.de
    Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
    Marc Hunger, Sybille Hellebrand
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