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    2006
    IEEE
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    Design Optimization for Robustness to Single Event Upsets
    13 years 10 months ago
    Design Optimization for Robustness to Single Event Upsets
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    Abstract: An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU...
    Quming Zhou, Mihir R. Choudhury, Kartik Mohanram
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