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DFT
2005
IEEE
81views VLSI» more  DFT 2005»
13 years 10 months ago
Noise Analysis of Fault Tolerant Active Pixel Sensors
As digital imagers grow in pixel count and area, the ability to correct for pixel defects becomes more important. A fault tolerant Active Pixel Sensor (APS) has previously been de...
Cory Jung, Mohammad Hadi Izadi, Michelle L. La Hay...