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SOCC
2008
IEEE
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13 years 11 months ago
Failure analysis for ultra low power nano-CMOS SRAM under process variations
— Several design metrics have been used in the past to evaluate the SRAM cell stability. However, most of them fail to provide the exact stability figures as shown in this paper...
Jawar Singh, Jimson Mathew, Dhiraj K. Pradhan, Sar...