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ICCAD
2003
IEEE
152views Hardware» more  ICCAD 2003»
14 years 1 months ago
Dynamic Fault-Tolerance and Metrics for Battery Powered, Failure-Prone Systems
Emerging VLSI technologies and platforms are giving rise to systems with inherently high potential for runtime failure. Such failures range from intermittent electrical and mechan...
Phillip Stanley-Marbell, Diana Marculescu