DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
DAC
2009
ACM
14 years 5 months ago
2009
ACM
Functional validation of a processor design through execution of a suite of test programs is common industrial practice. In this paper, we develop a high-level architectural speci...