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TCAD
2010
102views more  TCAD 2010»
12 years 11 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
DATE
2010
IEEE
149views Hardware» more  DATE 2010»
13 years 9 months ago
Efficient decision ordering techniques for SAT-based test generation
Model checking techniques are promising for automated generation of directed tests. However, due to the prohibitively large time and resource requirements, conventional model chec...
Mingsong Chen, Xiaoke Qin, Prabhat Mishra
ICCAD
2002
IEEE
116views Hardware» more  ICCAD 2002»
14 years 1 months ago
Conflict driven techniques for improving deterministic test pattern generation
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xiji...
VLSID
2009
IEEE
115views VLSI» more  VLSID 2009»
14 years 5 months ago
Efficient Techniques for Directed Test Generation Using Incremental Satisfiability
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
Prabhat Mishra, Mingsong Chen