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VTS
1997
IEEE
86views Hardware» more  VTS 1997»
9 years 4 months ago
Methods to reduce test application time for accumulator-based self-test
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
Albrecht P. Stroele, Frank Mayer
VTS
2007
IEEE
71views Hardware» more  VTS 2007»
9 years 6 months ago
Optimizing Test Length for Soft Faults in DRAM Devices
: Soft faults in DRAMs are faults that do not get sensitized directly after an operation is performed, but require a time to pass before the fault can be detected. Tests developed ...
Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev
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