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ICCD
2004
IEEE
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14 years 1 months ago
A Novel Low-Power Scan Design Technique Using Supply Gating
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Saibal Mukh...