ISCAS
2007
IEEE
13 years 10 months ago
2007
IEEE
Abstract— This paper quantifies the impact of threshold voltage variation on aging-related hard failure rates in a highperformance 65nm processor. Simulations show that threshol...
DAC
2006
ACM
14 years 5 months ago
2006
ACM
Process induced threshold voltage variations bring about fluctuations in circuit delay, that affect the FPGA timing yield. We propose an adaptive FPGA architecture that compensate...