Sciweavers

VTS
1999
IEEE
68views Hardware» more  VTS 1999»
13 years 9 months ago
A Test Point Insertion Algorithm for Mixed-Signal Circuits
This paper presents an algorithm based on testability measurement for test point insertion of mixed-signal circuits. Two transfer function models compatible with analog models are...
Jinyan Zhang, Sam D. Huynh, Mani Soma
ISCAS
1999
IEEE
109views Hardware» more  ISCAS 1999»
13 years 9 months ago
Solution of vector partial differential equations by transfer function models
Transfer function models for the descriptionof physical systems have recently been introduced to the field of multidimensional digital signal processing. They provide an alternati...
Rudolf Rabenstein, Lutz Trautmann