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ASPDAC
2006
ACM
100views Hardware» more  ASPDAC 2006»
13 years 10 months ago
Generation of shorter sequences for high resolution error diagnosis using sequential SAT
Commonly used pattern sources in simulation-based verification include random, guided random, or design verification patterns. Although these patterns may help bring the design ...
Sung-Jui (Song-Ra) Pan, Kwang-Ting Cheng, John Moo...