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    VLSID
    2010
    IEEE
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    A Combined DOE-ILP Based Power and Read Stability Optimization in Nano-CMOS SRAM
    13 years 8 months ago
    A Combined DOE-ILP Based Power and Read Stability Optimization in Nano-CMOS SRAM
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    A novel design approach for simultaneous power and stability (static noise margin, SNM) optimization of nanoCMOS static random access memory (SRAM) is presented. A 45nm single-end...
    Garima Thakral, Saraju P. Mohanty, Dhruva Ghai, Dh...
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