DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
An objective of DSP testing should be to ensure that any errors due to missed faults are infrequent compared to a circuit’s intrinsic errors, such as overflow. A method is prop...
DSD
2007
IEEE
13 years 11 months ago
2007
IEEE
Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...