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DAC
2012
ACM
11 years 7 months ago
Analysis of DC current crowding in through-silicon-vias and its impact on power integrity in 3D ICs
Due to the large geometry of through-silicon-vias (TSVs) and their connections to the power grid, significant current crowding can occur in 3D ICs. Prior works model TSVs and pow...
Xin Zhao, Michael Scheuermann, Sung Kyu Lim
DATE
2005
IEEE
121views Hardware» more  DATE 2005»
13 years 10 months ago
Reduction of CMOS Power Consumption and Signal Integrity Issues by Routing Optimization
— This paper suggests a methodology to decrease the power of a static CMOS standard cell design at layout level by focusing on switched capacitance. The term switched is the key:...
Paul Zuber, Armin Windschiegl, Raúl Medina ...