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    IEEE-ACM
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    WISE: Automated test generation for worst-case complexity
    13 years 11 months ago
    WISE: Automated test generation for worst-case complexity
    Download  www.eecs.berkeley.edu
    Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to ...
    Jacob Burnim, Sudeep Juvekar, Koushik Sen
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