Sciweavers

ICSE
2009
IEEE-ACM

WISE: Automated test generation for worst-case complexity

13 years 11 months ago
WISE: Automated test generation for worst-case complexity
Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to find performance bugs. Our complexity testing algorithm, which we call WISE (Worst-case Inputs from Symbolic Execution), operates on a program accepting inputs of arbitrary size. For each input size, WISE attempts to construct an input which exhibits the worst-case computational complexity of the program. WISE uses exhaustive test generation for small input sizes and generalizes the result of executing the program on those inputs into an “input generator.” The generator is subsequently used to efficiently generate worst-case inputs for larger input sizes. We have performed experiments to demonstrate the utility of our approach on a set of standard data structures and algorithms. Our results show that WISE can effectively generate worstcase inputs for several of these benchmarks.
Jacob Burnim, Sudeep Juvekar, Koushik Sen
Added 20 May 2010
Updated 20 May 2010
Type Conference
Year 2009
Where ICSE
Authors Jacob Burnim, Sudeep Juvekar, Koushik Sen
Comments (0)