Sciweavers

FAST
2010
13 years 7 months ago
Write Endurance in Flash Drives: Measurements and Analysis
We examine the write endurance of USB flash drives using a range of approaches: chip-level measurements, reverse engineering, timing analysis, whole-device endurance testing, and ...
Simona Boboila, Peter Desnoyers
MICRO
2009
IEEE
148views Hardware» more  MICRO 2009»
13 years 11 months ago
Flip-N-Write: a simple deterministic technique to improve PRAM write performance, energy and endurance
The phase-change random access memory (PRAM) technology is fast maturing to production levels. Main advantages of PRAM are non-volatility, byte addressability, in-place programmab...
Sangyeun Cho, Hyunjin Lee