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ICCD
2007
IEEE
105views Hardware» more  ICCD 2007»
14 years 3 months ago
Circuit-level mismatch modelling and yield optimization for CMOS analog circuits
A methodology for constructing circuit-level mismatch models and performing yield optimization is presented for CMOS analog circuits. The methodology combines statistical techniqu...
Mingjing Chen, Alex Orailoglu
DAC
2007
ACM
14 years 10 months ago
TROY: Track Router with Yield-driven Wire Planning
In this paper, we propose TROY, the first track router with yield-driven wire planning to optimize yield loss due to random defects. As the probability of failure (POF) computed f...
Minsik Cho, Hua Xiang, Ruchir Puri, David Z. Pan