EBIST: A Novel Test Generator with Built-In Fault Detection Capability

Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodologies are presented. The first one guarantees all single fault/error detection and the second methodology is capable of detecting multiple faults and errors. Furthermore the proposed LFSRs do not have additional hardware overhead. Also importantly the test patterns generated have the potential to achieve superior fault coverage.

• Type: Conference
• Year: 2003
• Where: DATE
• Authors: Dhiraj K. Pradhan, Chunsheng Liu, Krishnendu Chakrabarty
• Keywords: DATE 2003, Faults, Hardware, Test Pattern Generation, Test Patterns