4 search results - page 1 / 1 » EBIST: A Novel Test Generator with Built-In Fault Detection ... |
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodolog...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...
IEE
2010
13 years 3 months ago
2010
Popular code coverage measures, such as branch coverage, are indicators of the thoroughness rather than the fault detection capability of test suites. Mutation testing is a fault-...
DAC
2006
ACM
14 years 6 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...