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ISESE
2002
IEEE

Elimination of Crucial Faults by a New Selective Testing Method

13 years 9 months ago
Elimination of Crucial Faults by a New Selective Testing Method
Recent software systems contain a lot of functions to provide various services. According to this tendency, software testing becomes more difficult than before and cost of testing increases so much, since many test items are required. In this paper, we propose and discuss such a new selective software testing method that is constructed from previous testing method by simplifying testing specification. We have presented, in the previous work, a selective testing method to perform highly efficient software testing. The selective testing method has introduced an idea of functional priority testing and generated test items according to their functional priorities. Important functions with high priorities are tested in detail, and functions with low priorities are tested less intensively. As a result, additionalcost for generating testinginstructions becomes relatively high. In this paper, in order to reduce its cost, we change the way of giving informationwith respect to priorities. The ...
Masayuki Hirayama, Tetsuya Yamamoto, Jiro Okayasu,
Added 15 Jul 2010
Updated 15 Jul 2010
Type Conference
Year 2002
Where ISESE
Authors Masayuki Hirayama, Tetsuya Yamamoto, Jiro Okayasu, Osamu Mizuno, Tohru Kikuno
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