34 search results - page 1 / 7 » Elimination of Crucial Faults by a New Selective Testing Met... |
ISESE
2002
IEEE
13 years 9 months ago
2002
IEEE
Recent software systems contain a lot of functions to provide various services. According to this tendency, software testing becomes more difficult than before and cost of testing...
ET
2002
13 years 4 months ago
2002
In this paper we present a new reseeding technique for test-per-clock test pattern generation suitable for at-speed testing of circuits with random-pattern resistant faults. Our te...
ASPDAC
2004
ACM
13 years 10 months ago
2004
ACM
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
ICASSP
2008
IEEE
13 years 11 months ago
2008
IEEE
In this paper we propose a new method to reduce noise in digital images. The method is based on the bilateral filter. The bilateral filter is a nonlinear filter that does spati...