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DATE
2000
IEEE

The Road to Better Reliability and Yield Embedded DfM Tools

13 years 9 months ago
The Road to Better Reliability and Yield Embedded DfM Tools
This paper gives an overview of the different tools, needed for accomplishing optimal IC manufacturability and rapid technology learning during the successive phases of process maturity. The paper then describes two specific DfM tools that are in use within Philips Semiconductors.
Kees Veelenturf
Added 30 Jul 2010
Updated 30 Jul 2010
Type Conference
Year 2000
Where DATE
Authors Kees Veelenturf
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