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DATE
1997
IEEE
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New static compaction techniques of test sequences for sequential circuits

16 years 3 days ago
New static compaction techniques of test sequences for sequential circuits
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,
Added 06 Aug 2010
Updated 06 Aug 2010
Type Conference
Year 1997
Where DATE
Authors Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda
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