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DATE
1997
IEEE
109views Hardware» more  DATE 1997»
9 years 9 months ago
Sequential circuit test generation using dynamic state traversal
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
DATE
1997
IEEE
116views Hardware» more  DATE 1997»
9 years 10 months ago
A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs
In this paper a new approach is presented to build a list of faults to be used by the fault injection environment; the list is built starting from a high-level description of the ...
Alfredo Benso, Paolo Prinetto, Maurizio Rebaudengo...
DATE
1997
IEEE
124views Hardware» more  DATE 1997»
9 years 10 months ago
A controller testability analysis and enhancement technique
This paper presents a testability analysis and improvement technique for the controller of an RT level design. It detects hard-to-reachstates by analyzing both the data path and t...
Xinli Gu, Erik Larsson, Krzysztof Kuchcinski, Zebo...
DATE
1997
IEEE
107views Hardware» more  DATE 1997»
9 years 10 months ago
Exploiting temporal independence in distributed preemptive circuit simulation
In digital circuit simulation hidden opportunities for concurrent execution of models often exist, arising from the propagation delay associated with the generation of output even...
Peter Walker, Sumit Ghosh
DATE
1997
IEEE
114views Hardware» more  DATE 1997»
9 years 10 months ago
Compact structural test generation for analog macros
A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IVconverter macro design....
V. Kaal, Hans G. Kerkhoff
DATE
1997
IEEE
74views Hardware» more  DATE 1997»
9 years 10 months ago
Efficient and accurate testing of analog-to-digital converters using oscillation-test method
This paper describes a practical test approach for analog-to-digital converters (ADCs) based on the oscillation-test strategy. The oscillation-test is applied to convert the ADC u...
Karim Arabi, Bozena Kaminska
DATE
1997
IEEE
88views Hardware» more  DATE 1997»
9 years 10 months ago
VHDL extensions for complex transmission line simulation
This paper proposes extensions to the VHDL grammar and de nes new semantics in the language to model the timing behavior of high frequency buses and clock lines with multiple, dis...
Peter Walker, Sumit Ghosh
DATE
1997
IEEE
95views Hardware» more  DATE 1997»
9 years 10 months ago
Synthesis of multi-rate and variable rate circuits for high speed telecommunications applications
A design methodology for the synthesis of digital circuits used in high throughput digital modems is presented. The methodology spans digital modem design from the link level to t...
Patrick Schaumont, Serge Vernalde, Luc Rijnders, M...
DATE
1997
IEEE
74views Hardware» more  DATE 1997»
9 years 10 months ago
An algorithm for numerical reference generation in symbolic analysis of large analog circuits
Ignacio Garcia-Vargas, Mariano Galan, Francisco V....
DATE
1997
IEEE
89views Hardware» more  DATE 1997»
9 years 10 months ago
Smart sensor system application: an integrated compass
Ronald J. W. T. Tangelder, G. Diemel, Hans G. Kerk...
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