A coaxial optical scanner for synchronous acquisition of 3D geometry and surface reflectance

Shifted sinusoidal illumination patterns are useful for appearance capture because they simultaneously separate local and non-local reflections and allow the recovery of surface geometry. Here we show that the same illumination patterns can be used to estimate the local surface reflectance (BRDF) as well, provided that an appropriate correction factor is applied. We derive a closed-form expression for this correction factor, validate it experimentally, and discuss its implications. 1 Preliminaries

• Type: Conference
• Year: 2010
• Where: SIGGRAPH
• Authors: Michael Holroyd, Jason Lawrence, Todd Zickler
• Keywords: Computer Graphics, Correction Factor, Illumination Patterns, SIGGRAPH 2010, Sinusoidal Illumination Patterns