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7

ASPDAC
1995
ACM

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58views Hardware» more ASPDAC 1995»

A tool for measuring quality of test pattern for LSIs' functional design

13 years 8 months ago

A tool for measuring quality of test pattern for LSIs' functional design

Download www.cs.york.ac.uk

Takashi Aoki, Tomoji Toriyama, Kenji Ishikawa, Ken

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ASPDAC 1995 | Hardware |

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Added	25 Aug 2010
Updated	25 Aug 2010
Type	Conference
Year	1995
Where	ASPDAC
Authors	Takashi Aoki, Tomoji Toriyama, Kenji Ishikawa, Kennosuke Fukami

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