ASPDAC 1995 - PDF Preprint Papers

ASPDAC 1995 Asia and South Pacific Design Automation Conference

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ASPDAC
1995
ACM

130views Hardware» more ASPDAC 1995»

Design for testability using register-transfer level partial scan selection

13 years 8 months ago

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Abstract - An approach to top down design for testability using register-transfer level(RTL) partial scan selection is described. We propose a scan selection technique based on tes...

Akira Motohara, Sadami Takeoka, Toshinori Hosokawa...

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