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ASPDAC   1995 Asia and South Pacific Design Automation Conference
Wall of Fame | Most Viewed ASPDAC-1995 Paper
ASPDAC
1995
ACM
130views Hardware» more  ASPDAC 1995»
9 years 7 months ago
Design for testability using register-transfer level partial scan selection
Abstract - An approach to top down design for testability using register-transfer level(RTL) partial scan selection is described. We propose a scan selection technique based on tes...
Akira Motohara, Sadami Takeoka, Toshinori Hosokawa...
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