Collection and Analysis of Microprocessor Design Errors

Research on practical design verification techniques has long been impeded by the lack of published and yet detailed error data. Over the last few years we have systematically collected design error data from a number of academic microprocessor design projects. We present an analysis of this data and report on the lessons learned in the collection effort.

• Type: Journal
• Year: 2000
• Where: DT
• Authors: David Van Campenhout, Trevor N. Mudge, John P. Hayes
• Keywords: Design Error Data, DT 2000, Error Data, Practical Design Verification