SOC Test Architecture Optimization for Signal Integrity Faults on Core-External Interconnects

The test time for core-external interconnect shorts/opens is typically much less than that for core-internal logic. Therefore, prior work on test infrastructure design for core-based system-on-a-chip (SOC) has mainly focused on minimizing the test time for core-internal logic. However, as feature sizes shrink for newer process technologies, the test time for interconnect signal integrity (SI) faults cannot be neglected. We investigate the impact of interconnect SI tests on SOC test architecture design and optimization. We present a compaction method for SI faults and algorithms for test architecture optimization. Experimental results for the ITC'02 benchmarks show that the proposed approach can significantly reduce the overall testing time for core-internal logic and core-external interconnects. Categories and Subject Descriptors B.7.3 [Integrated Circuits]: Reliability and Testing General Terms Reliability, Design, Algorithms. Keywords Signal Integrity, Interconnects, Test Archi...

• Type: Conference
• Year: 2007
• Where: DAC
• Authors: Qiang Xu, Yubin Zhang, Krishnendu Chakrabarty
• Keywords: DAC 2007, Design Automation, SOC Test Architecture, Test Architecture Optimization, Test Time