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DFT
2003
IEEE

Buffer and Controller Minimisation for Time-Constrained Testing of System-On-Chip

10 years 2 months ago
Buffer and Controller Minimisation for Time-Constrained Testing of System-On-Chip
Test scheduling and Test Access Mechanism (TAM) design are two important tasks in the development of a System-on-Chip (SOC) test solution. Previous test scheduling techniques assume a dedicated designed TAM which have the advantage of high flexibility in the scheduling process. However, hardware overhead for implementing the TAM and additional routing is required of the TAMs. In this paper we propose a technique that makes use of the existing functional buses for the test data transportation inside the SOC. We have dealt with the test scheduling problem with this new assumption and developed a technique to minimise the test-controller and buffer size for a busbased multi-core SOC. We have solved the problem by using a constraint logic programming (CLP) technique and demonstrated the efficiency of our approach by running experiments on benchmark designs.
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where DFT
Authors Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng
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