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DATE
2007
IEEE

Dynamic learning based scan chain diagnosis

10 years 6 months ago
Dynamic learning based scan chain diagnosis
Scan chain defect diagnosis is important to silicon debug and yield enhancement. Traditional simulationbased chain diagnosis algorithms may take long run time if a large number of simulations are required. In this paper, a novel dynamic learning based scan chain diagnosis is proposed to speedup the diagnosis run time. Experimental results illustrate that by using the proposed dynamic learning techniques, the diagnosis run time can be reduced about 10X on average.
Yu Huang
Added 02 Jun 2010
Updated 02 Jun 2010
Type Conference
Year 2007
Where DATE
Authors Yu Huang
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