44 search results - page 1 / 9 » Dynamic learning based scan chain diagnosis |
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Scan chain defect diagnosis is important to silicon debug and yield enhancement. Traditional simulationbased chain diagnosis algorithms may take long run time if a large number of...
ATS
2009
IEEE
13 years 12 months ago
2009
IEEE
—In the past, software based scan chain defect diagnosis can be roughly classified into two categories (1) model-based algorithms, and (2) data-driven algorithms. In this paper w...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test v...
VLSID
2005
IEEE
14 years 5 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...