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DATE
2002
IEEE

Gate Level Fault Diagnosis in Scan-Based BIST

13 years 8 months ago
Gate Level Fault Diagnosis in Scan-Based BIST
A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test vector information and enables location identification of single stuck-at faults to a neighborhood of a few gates through set operations on small pass/fail dictionaries. The proposed scheme is applicable to multiple stuck-at faults and bridging faults as well. The practical applicability of the suggested ideas is confirmed through numerous experimental runs on all three fault models.
Ismet Bayraktaroglu, Alex Orailoglu
Added 14 Jul 2010
Updated 14 Jul 2010
Type Conference
Year 2002
Where DATE
Authors Ismet Bayraktaroglu, Alex Orailoglu
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