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8

DATE
2005
IEEE

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An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories

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An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories

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Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey

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Added	24 Jun 2010
Updated	24 Jun 2010
Type	Conference
Year	2005
Where	DATE
Authors	Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey

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