6 search results - page 1 / 2 » An Efficient Transparent Test Scheme for Embedded Word-Orien... |
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
EDCC
1999
Springer
13 years 9 months ago
1999
Springer
Abstract. The paper presents a new approach to transparent BIST for wordoriented RAMs which is based on the transformation of March transparent test algorithms to the symmetric ver...
VLSID
2001
IEEE
14 years 5 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
ITC
1996
IEEE
13 years 9 months ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
VTS
2006
IEEE
13 years 11 months ago
2006
IEEE
We consider self-testing of complete wireless nodes in the field through a low-energy software-based selftest (SBST) method. Energy consumption is optimized both for individual co...