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14

ISMVL
1994
IEEE

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Full Sensitivity and Test Generation for Multiple-Valued Logic Circuits

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Full Sensitivity and Test Generation for Multiple-Valued Logic Circuits

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Elena Dubrova, Dilian Gurov, Jon C. Muzio

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Added	09 Aug 2010
Updated	09 Aug 2010
Type	Conference
Year	1994
Where	ISMVL
Authors	Elena Dubrova, Dilian Gurov, Jon C. Muzio

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