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2005
IEEE

Hybrid BIST Based on Repeating Sequences and Cluster Analysis

10 years 5 months ago
Hybrid BIST Based on Repeating Sequences and Cluster Analysis
We present a hybrid BIST approach that extracts the most frequently occurring sequences from deterministic test patterns; these extracted sequences are stored on-chip. We use cluster analysis for sequence extraction, and encode deterministic patterns on the basis of the stored sequences. Experimental results for the ISCAS-89 benchmark circuits show that the proposed approach often requires less on-chip storage and test data volume than other recent BIST methods.
Lei Li, Krishnendu Chakrabarty
Added 24 Jun 2010
Updated 24 Jun 2010
Type Conference
Year 2005
Where DATE
Authors Lei Li, Krishnendu Chakrabarty
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