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2002
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Incremental Diagnosis of Multiple Open-Interconnects

10 years 4 months ago
Incremental Diagnosis of Multiple Open-Interconnects
With increasing chip interconnect distances, openinterconnect is becoming an important defect. The main challenge with open-interconnects stems from its non-deterministic real-life behavior. In this work, we present an efficient diagnostic technique for multiple openinterconnects. The algorithm proceeds in two phases. During the first phase, potential solution sets are identified following a model-free incremental diagnosis methodology. Heuristics are devised to speed up this step and screen the solution space efficiently. In the second phase, a generalized fault simulation scheme enumerates all possible faulty behaviors for each solution from the first phase. We conduct experiments on combinational and full-scan sequential circuits with one, two and three open faults. The results are very encouraging.
Jiang Brandon Liu, Andreas G. Veneris, Hiroshi Tak
Added 15 Jul 2010
Updated 15 Jul 2010
Type Conference
Year 2002
Where ITC
Authors Jiang Brandon Liu, Andreas G. Veneris, Hiroshi Takahashi
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