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    2005
    ACM
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    Interconnect and current density stress: an introduction to electromigration-aware design

    13 years 10 months ago
    Interconnect and current density stress: an introduction to electromigration-aware design
    Download  www.tu-dresden.de
    Jens Lienig
    claim paper
    Added 26 Jun 2010
    Updated 26 Jun 2010
    Type Conference
    Year 2005
    Where SLIP
    Authors Jens Lienig
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