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ITC
2003
IEEE

Latch Divergency In Microprocessor Failure Analysis

13 years 9 months ago
Latch Divergency In Microprocessor Failure Analysis
This paper presents an approach for analysis of system state differences observable through the scan chain for the debug of functional failures. A novel methodology for Latch Divergence Analysis (LDA) is proposed for creating stable failure signatures and reducing system noise. The methodology and processing flow have been integrated into the normal debug flow for the UltraSPARCTM family processors and have been successfully applied in numerous debugs in the bring-up of new products.
Peter Dahlgren, Paul Dickinson, Ishwar Parulkar
Added 04 Jul 2010
Updated 04 Jul 2010
Type Conference
Year 2003
Where ITC
Authors Peter Dahlgren, Paul Dickinson, Ishwar Parulkar
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