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10

ATS
2009
IEEE

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New Class of Tests for Open Faults with Considering Adjacent Lines

13 years 9 months ago

New Class of Tests for Open Faults with Considering Adjacent Lines

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Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamats

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Added	21 Jul 2010
Updated	21 Jul 2010
Type	Conference
Year	2009
Where	ATS
Authors	Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Toshiyuki Tsutsumi, Hiroyuki Yotsuyanagi, Masaki Hashizume

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