ATS
2009
IEEE
13 years 2 months ago
2009
IEEE
Negative bias temperature instability (NBTI) has been a significant reliability concern in current digital circuit design due to its effect of increasing the path delay with time a...
ATS
2009
IEEE
13 years 9 months ago
2009
IEEE
ATS
2009
IEEE
13 years 9 months ago
2009
IEEE
Caches are crucial components in modern processors (both stand-alone or integrated into SoCs) and their test is a challenging task, especially when addressing complex and high-fre...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
Embedded memory quality is critical to overall chip quality. New defect mechanisms that occur at advanced process nodes (65nm and below) are often more pronounced in memories due ...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
—In the past, software based scan chain defect diagnosis can be roughly classified into two categories (1) model-based algorithms, and (2) data-driven algorithms. In this paper w...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
Abstract—SAT-based ATPG turned out to be a robust alternative to classical structural ATPG algorithms such as FAN. The number of unclassified faults can be significantly reduce...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
As diagnostic testing for memory devices increasingly gains in importance, companies are looking for flexible, cost effective methods to perform diagnostics on their failing devi...