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IOLTS
2008
IEEE

Physical Demonstration of Polymorphic Self-Checking Circuits

13 years 11 months ago
Physical Demonstration of Polymorphic Self-Checking Circuits
Polymorphic gates can be considered as a new reconfigurable technology capable of integrating logic functions with sensing in a single compact structure. Polymorphic gates whose logic function can be controlled by the level of the power supply voltage (Vdd) represent a special class of polymorphic gates. A new polymorphic NAND/NOR gate controlled by Vdd is presented. This gate was fabricated and utilized in a self-checking polymorphic adder. This paper presents an experimental evaluation of this novel implementation.
Richard Ruzicka, Lukás Sekanina, Roman Prok
Added 31 May 2010
Updated 31 May 2010
Type Conference
Year 2008
Where IOLTS
Authors Richard Ruzicka, Lukás Sekanina, Roman Prokop
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