| Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning Recent academic inistitutions visiting this post, which is a subset of the total traffic |  |
| Data is not available yet. |
| Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning Recent academic inistitutions visiting this post, which is a subset of the total traffic | |
| Data is not available yet. |