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DATE
2005
IEEE

Rapid Generation of Thermal-Safe Test Schedules

10 years 3 months ago
Rapid Generation of Thermal-Safe Test Schedules
Overheating has been acknowledged as a major issue in testing complex SOCs. Several power constrained system-level DFT solutions (power constrained test scheduling) have recently been proposed to tackle this problem. However, as it will be shown in this paper, imposing a chip-level maximum power constraint doesn’t necessarily avoid local overheating due to the non-uniform distribution of power across the chip. This paper proposes a new approach for dealing with overheating during test, by embedding thermal awareness into test scheduling. The proposed approach facilitates rapid generation of thermal-safer test schedules without requiring time-consuming thermal simulations. This is achieved by employing a lowcomplexity test session thermal model used to guide the test schedule generation algorithm. This approach reduces the chances of a design re-spin due to potential overheating during test.
Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu
Added 24 Jun 2010
Updated 24 Jun 2010
Type Conference
Year 2005
Where DATE
Authors Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu Chakrabarty
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