Some Common Aspects of Design Validation, Debug and Diagnosis

— Design, Verification and Test of integrated circuits with millions of gates put strong requirements on design time, test volume, test application time, test speed and diagnostic resolution. In this paper, an overview is given on the common aspects of these tasks and how they interact. Diagnosis techniques may be used after manufacturing, for chip characterization and field return analysis, and even for rapid prototyping.

• Type: Conference
• Year: 2006
• Where: DELTA
• Authors: Talal Arnaout, Gunter Bartsch, Hans-Joachim Wunderlich
• Keywords: DELTA 2006, Test Application Time, Test Volume, field Return Analysis